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IEC 62047-40 Ed. 1.0 en:2021

Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold

International Electrotechnical Commission, 09/01/2021

Publisher: IEC

File Format: PDF

$25.00$51.00


Published:01/09/2021

Pages:16

File Size:1 file , 1.2 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open microelectromechanical inertial shock switch.

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