IEC 62276 Ed. 3.0 b:2016

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

International Electrotechnical Commission, 10/24/2016

Publisher: IEC

File Format: PDF

$139.00$278.00


Published:24/10/2016

Pages:79

File Size:1 file , 1.4 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62276:2016 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- Corrections of Euler angle indications in Table 1 and axis directions in Figure 3.
- Definition of "twin" is not explained clearly enough in 3.3.3. Therefore it is revised by a more detailed definition.
- Etch channels maximum number at quartz wafer of seed which do not pass through from surface to back surface are classified for three grades in 4.2.13 a). Users use seed portions of quartz wafers for devices. They request quartz wafers with less etch channels in seeds to reduce defects of devices. The classification of etch channels in seed may prompt a rise in quartz wafer quality.

More IEC standard pdf

IEC 60050-902 Ed. 1.0 b:2013

IEC 60050-902 Ed. 1.0 b:2013

International Electrotechnical Vocabulary (IEV) - Part 902: Conformity assessment

$47.00 $95.00

IEC 60603-7-51 Ed. 1.0 b:2010

IEC 60603-7-51 Ed. 1.0 b:2010

Connectors for electronic equipment - Part 7-51: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 500 MHz

$47.00 $95.00

IEC 61970-403 Ed. 1.0 en:2008

IEC 61970-403 Ed. 1.0 en:2008

Energy management system application program interface (EMS-API) - Part 403: Generic data access

$94.00 $189.00

IEC 61987-13 Ed. 1.0 b:2016

IEC 61987-13 Ed. 1.0 b:2016

Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 13: Lists of properties (LOP) for pressure measuring equipment for electronic data exchange

$95.00 $190.00