IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

International Electrotechnical Commission, 03/29/2007

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Published:29/03/2007

Pages:43

File Size:1 file , 720 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

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