• IEC 62396-2 Ed. 1.0 en:2012

IEC 62396-2 Ed. 1.0 en:2012

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

International Electrotechnical Commission, 09/27/2012

Publisher: IEC

File Format: PDF

$117.00$235.00


Published:27/09/2012

Pages:38

File Size:1 file , 570 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2:
- additional information on heavy ion data, neutron and proton data and thermal neutron data;
- updates with regard to neutron sources: additional radiation simulators;
- addition of the Anita spallation neutron source;
- additional information on whole system and equipment testing;
- comparison between accelerator based neutron sources.

More IEC standard pdf

IEC 60852-4 Ed. 1.0 b:1996

IEC 60852-4 Ed. 1.0 b:1996

Outline dimensions of transformers and inductors for use in telecommunication and electronic equipment - Part 4: Transformers and inductors using YUI-2 laminations

$72.00 $145.00

IEC 60311 Amd.1 Ed. 4.0 b:2005

IEC 60311 Amd.1 Ed. 4.0 b:2005

Amendment 1 - Electric irons for household or similar use - Methods for measuring performance

$12.00 $24.00

IEC 61747-6 Ed. 1.0 b:2004

IEC 61747-6 Ed. 1.0 b:2004

Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type

$94.00 $189.00

IEC 60191-6-16 Ed. 1.0 en:2007

IEC 60191-6-16 Ed. 1.0 en:2007

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

$34.00 $68.00