IEC 62526 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

International Electrotechnical Commission, 11/07/2007

Publisher: IEC

File Format: PDF

$240.00$481.00

Description

Published:07/11/2007

Pages:123

File Size:1 file , 1.5 MB

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Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

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