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IEC 62528 Ed. 1.0 en:2007

Standard Testability Method for Embedded Core-based Integrated Circuits

International Electrotechnical Commission, 11/07/2007

Publisher: IEC

File Format: PDF

$240.00$481.00


Published:07/11/2007

Pages:125

File Size:1 file , 2.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

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