IEC 62884-3 Ed. 1.0 b:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

International Electrotechnical Commission, 03/22/2018

Publisher: IEC

File Format: PDF

$47.00$95.00


Published:22/03/2018

Pages:26

File Size:1 file , 1.1 MB

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IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

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