IEC 62951-3 Ed. 1.0 en:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

International Electrotechnical Commission, 11/07/2018

Publisher: IEC

File Format: PDF

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Description

Published:07/11/2018

Pages:22

File Size:1 file , 1.4 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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