IEC 62951-6 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

International Electrotechnical Commission, 05/06/2019

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Published:06/05/2019

Pages:50

File Size:1 file , 1.9 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

More IEC standard pdf

IEC 61280-4-1 Ed. 1.0 b:2003

Fibre-optic communication subsystem test procedures - Part 4-1: Cable plant and links - Multimode fibre-optic cable plant attenuation measurement

$48.00 $97.00

IEC 60909-3 Ed. 2.0 b:2003

Short-circuit currents in three-phase a.c. systems - Part 3: Currents during two separate simultaneous line-to-earth short circuits and partial short-circuit currents flowing through earth

$71.00 $143.00

IEC 61261-2 Ed. 1.0 b:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

$95.00 $190.00

IEC 61234-1 Ed. 1.0 b:1994

Method of test for the hydrolytic stability of electrical insulating materials - Part 1: Plastic films

$12.00 $25.00