• Your shopping cart is empty!

  • IEEE 1500-2005

IEEE 1500-2005

IEEE Standard Testability Method for Embedded Core-based Integrated Circuits

IEEE, 08/29/2005

Publisher: IEEE

File Format: PDF

$75.00$150.00


Published:29/08/2005

Pages:117

File Size:1 file , 1.1 MB

Note:This product is unavailable in Russia, Belarus

IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.

More IEEE standard pdf

IEEE C37.41-2000

IEEE C37.41-2000

IEEE Standard Design Tests For High-Voltage Fuses, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories

$71.00 $142.00

IEEE C37.081a-1997

IEEE C37.081a-1997

Supplement to IEEE Guide for Synthetic Fault Testing of AC High Voltage Circuit Breakers Rated on a Symmetrical Current Basis

$141.00 $282.70

IEEE 12207.0-1996

IEEE 12207.0-1996

IEEE/EIA Standard - Industry Implementation of International Standard ISO/IEC 12207:1995 (ISO/IEC 12207) Standard for Information Technology -- Software Life Cycle Processes

$81.00 $163.00

IEEE 1377/C12.19-1997

IEEE 1377/C12.19-1997

Standard for Utility Industry End Device Data Tables

$128.00 $256.83