• Your shopping cart is empty!

  • IEEE 1500-2005

IEEE 1500-2005

IEEE Standard Testability Method for Embedded Core-based Integrated Circuits

IEEE, 08/29/2005

Publisher: IEEE

File Format: PDF

$75.00$150.00


Published:29/08/2005

Pages:117

File Size:1 file , 1.1 MB

Note:This product is unavailable in Russia, Belarus

IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.

More IEEE standard pdf

IEEE 1562-2007

IEEE 1562-2007

IEEE Guide for Array and Battery Sizing in Stand-Alone Photovoltaic (PV) Systems

$52.00 $104.00

IEEE 1561-2007

IEEE 1561-2007

IEEE Guide for Optimizing the Performance and Life of Lead-Acid Batteries in Remote Hybrid Power Systems

$52.00 $104.00

IEEE C37.122.1-2014

IEEE C37.122.1-2014

IEEE Guide for Gas-Insulated Substations Rated Above 52 kV

$67.00 $134.00

IEEE 1610-2007

IEEE 1610-2007

IEEE Guide for the Application of Faulted Circuit Indicators for 200 / 600 A, Three-phase Underground Distribution

$41.00 $82.00