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  • IEEE 1505.1-2008

IEEE 1505.1-2008

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE, 08/01/2013

Publisher: IEEE

File Format: PDF

$55.00$111.00


Published:01/08/2013

Pages:170

File Size:1 file , 1.9 MB

Note:This product is unavailable in Russia, Belarus

The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

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