• Your shopping cart is empty!

  • IEEE 1505.1-2008

IEEE 1505.1-2008

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE, 08/01/2013

Publisher: IEEE

File Format: PDF

$55.00$111.00


Published:01/08/2013

Pages:170

File Size:1 file , 1.9 MB

Note:This product is unavailable in Russia, Belarus

The scope of this standard is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

More IEEE standard pdf

IEEE C57.13.1-2006

IEEE C57.13.1-2006

IEEE Guide for Field Testing of Relaying Current Transformers

$41.00 $82.00

IEEE C57.12.00-2006

IEEE C57.12.00-2006

IEEE Standard General Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers

$67.00 $134.00

IEEE 463-2006

IEEE 463-2006

IEEE Standard for Electrical Safety Practices in Electrolytic Cell Line Working Zones

$52.00 $104.00

IEEE C37.102-2006

IEEE C37.102-2006

IEEE Guide for AC Generator Protection

$41.00 $82.00