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IEEE 1505.1-2019

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE, 08/20/2019

Publisher: IEEE

File Format: PDF

$76.00$152.00


Published:20/08/2019

Pages:157

File Size:1 file , 9 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505(TM) receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

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