IEEE 1505.1-2019

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE, 08/20/2019

Publisher: IEEE

File Format: PDF

$76.00$152.00


Published:20/08/2019

Pages:157

File Size:1 file , 9 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505(TM) receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

More IEEE standard pdf

IEEE C62.36-2000

IEEE C62.36-2000

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

$64.00 $128.00

IEEE 1275.4-1995

IEEE 1275.4-1995

IEEE Standard for Boot (Initialization Configuration) Firmware: Bus Supplement for IEEE 896 (Futurebus+(R))

$63.00 $126.00

IEEE C57.12.91-1995

IEEE C57.12.91-1995

IEEE Standard Test Code for Dry-Type Distribution and Power Transformers

$77.00 $154.00

IEEE C57.19.100-1995

IEEE C57.19.100-1995

IEEE Guide for Application of Power Apparatus Bushings

$71.00 $142.00