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IEEE, 07/06/2006
Publisher: IEEE
File Format: PDF
$52.00$104.00
Published:06/07/2006
Pages:116
File Size:1 file , 1.5 MB
Note:This product is unavailable in Russia, Belarus
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
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IEEE Standard Methods for Measuring Transmission Performance of Analog and Digital Telephone Sets, Handsets, and Headsets
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IEEE Standard for Information Technology--System and Software Life Cycle Processes--Reuse Processes
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IEEE Standard for Modeling and Simulation (M&S) High Level Architecture (HLA)-- Object Model Template (OMT) Specification
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