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  • IEEE 1620-2004

IEEE 1620-2004

Standard for Test Methods for the Characterization of Organic Transistors and Materials

IEEE, 04/29/2004

Publisher: IEEE

File Format: PDF

$67.00$134.00


Published:29/04/2004

Pages:20

File Size:1 file , 140 KB

Note:This product is unavailable in Russia, Belarus

This project will develop standard methods for the characterization of organic transistors and materials. The methods will be independent of processing routes used to fabricate the transistors. The characterization methods will be usable for all transistors comprised of organic semiconductor materials.

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