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  • IEEE 1620-2008

IEEE 1620-2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

IEEE, 12/05/2008

Publisher: IEEE

File Format: PDF

$46.00$92.00


Published:05/12/2008

Pages:26

File Size:1 file , 750 KB

Note:This product is unavailable in Russia, Belarus

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

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