IEEE 1671.5-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

IEEE, 02/01/2012

Publisher: IEEE

File Format: PDF

$23.00$46.00

Description

Published:01/02/2012

Pages:29

File Size:1 file , 500 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the test adapter information by defining the interface between the UUT and the test station, which includes the description of the test adapter (e.g., physical and electrical characteristics, capabilities/performance, and identification/classification).

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