IEEE 1671.6-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

IEEE, 02/01/2013

Publisher: IEEE

File Format: PDF

$33.00$67.00

Description

Published:01/02/2013

File Size:1 file , 500 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).

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