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IEEE 1696-2013

IEEE Standard for Terminology and Test Methods for Circuit Probes

IEEE, 02/14/2014

Publisher: IEEE

File Format: PDF

$52.00$104.00


Published:14/02/2014

Pages:65

File Size:1 file , 5.2 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.

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