IEEE 592-2007

IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

IEEE, 05/08/2008

Publisher: IEEE

File Format: PDF

$50.00$100.00

Description

Published:08/05/2008

Pages:10

File Size:1 file , 1 MB

Note:This product is unavailable in Russia, Belarus

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

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