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IEEE, 02/05/2010
Publisher: IEEE
File Format: PDF
$92.00$184.00
Published:05/02/2010
Pages:205
File Size:1 file , 2 MB
Note:This product is unavailable in Russia, Belarus
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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