IEEE C62.35-2010

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

IEEE, 08/31/2010

Publisher: IEEE

File Format: PDF

$61.00$123.00


Published:31/08/2010

Pages:26

File Size:1 file , 420 KB

Note:This product is unavailable in Russia, Belarus

This standard applies to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). In this document, these devices will be called ABDs. ABDs limit (clamp) transient voltages and divert transient currents. This standard contains terms, symbols and definitions, and provides test methods for verifying ratings and measuring device characteristics. Service conditions and failure mode are also provided. This standard may also apply to other silicon surge protective device components with similar V-I characteristics.

More IEEE standard pdf

IEEE 7010-2020

IEEE 7010-2020

IEEE Recommended Practice for Assessing the Impact of Autonomous and Intelligent Systems on Human Well-Being

$62.00 $124.00

IEEE 389-2020

IEEE 389-2020

IEEE Recommended Practice for Testing Transformers and Inductors for Electronics Applications

$49.00 $99.00

IEEE 1653.2-2020

IEEE 1653.2-2020

IEEE Standard for Uncontrolled Traction Power Rectifiers for Substation Applications up to 1500 V DC Nominal Output

$40.00 $80.00

IEEE 2790-2020

IEEE 2790-2020

IEEE Standard for Biometric Liveness Detection

$27.00 $54.00