IEEE C62.35-2010

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

IEEE, 08/31/2010

Publisher: IEEE

File Format: PDF

$61.00$123.00


Published:31/08/2010

Pages:26

File Size:1 file , 420 KB

Note:This product is unavailable in Russia, Belarus

This standard applies to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). In this document, these devices will be called ABDs. ABDs limit (clamp) transient voltages and divert transient currents. This standard contains terms, symbols and definitions, and provides test methods for verifying ratings and measuring device characteristics. Service conditions and failure mode are also provided. This standard may also apply to other silicon surge protective device components with similar V-I characteristics.

More IEEE standard pdf

IEEE 1475-1999

IEEE 1475-1999

IEEE Standard for the Functioning of and Interfaces Among Propulsion, Friction Brake, and Train-borne Master Control on Rail Rapid Transit Vehicles

$59.00 $119.00

IEEE 1473-1999

IEEE 1473-1999

IEEE Standard for Communications Protocol Aboard Trains

$56.00 $113.00

IEEE 1512-2006

IEEE 1512-2006

IEEE Standard for Common Incident Management Message Sets for Use by Emergency Management Centers

$111.00 $223.00

IEEE C2-2007-HB

IEEE C2-2007-HB

National Electrical Safety Code Handbook (NESC), Sixth Edition

$127.00 $255.00