IEEE C62.35-2010/Cor 1-2018

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1

IEEE, 12/12/2018

Publisher: IEEE

File Format: PDF

$100.00$201.93

Published:12/12/2018

Pages:9

File Size:1 file , 2.2 MB

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No change to document scope only to item 8.8.1b) on page 13, the word "maximum" should be "minimum"

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