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IEEE C62.59-2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

IEEE, 10/31/2019

Publisher: IEEE

File Format: PDF

$31.00$63.00


Published:31/10/2019

Pages:40

File Size:1 file , 1.6 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: - Forward biased diodes - Zener breakdown diodes - Avalanche breakdown diodes - Punch-through diodes - Foldback diodes

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