• Your shopping cart is empty!

PDF Preview

IEEE C62.59-2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

IEEE, 10/31/2019

Publisher: IEEE

File Format: PDF

$31.00$63.00


Published:31/10/2019

Pages:40

File Size:1 file , 1.6 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: - Forward biased diodes - Zener breakdown diodes - Avalanche breakdown diodes - Punch-through diodes - Foldback diodes

More IEEE standard pdf

IEEE 1910.1-2020

IEEE 1910.1-2020

IEEE Standard for Meshed Tree Bridging with Loop-Free Forwarding

$32.00 $64.00

IEEE 2140.1-2020

IEEE 2140.1-2020

IEEE Standard for General Requirements for Cryptocurrency Exchanges

$28.00 $56.00

IEEE 802E-2020

IEEE 802E-2020

IEEE Recommended Practice for Privacy Considerations for IEEE 802(R) Technologies

$40.00 $80.00

IEEE 1623-2020

IEEE 1623-2020

IEEE Guide for the Functional Specification of Medium Voltage (1kV to 35kV) Electronic Shunt Devices for Dynamic Voltage Compensation

$28.00 $56.00