• IPC 9261

IPC 9261

In-Process DPMO and Estimated Yield for PWAs

Association Connecting Electronics Industries, 03/01/2002

Publisher: IPC

File Format: PDF

$30.00$60.00


Published:01/03/2002

Pages:24

File Size:1 file , 170 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates.

More IPC standard pdf

IPC A-42-G

IPC A-42-G

Double Sided Artwork - Gerber Format

$35.00 $71.00

IPC A-22-D

IPC A-22-D

UL Recognition Test Pattern - Data - D-350

$35.00 $71.00

IPC A-22-G

IPC A-22-G

UL Recognition Test Pattern - Gerber Format

$35.00 $71.00

IPC A-24-G

IPC A-24-G

Surface Insulation Resistance - Gerber Format

$43.00 $87.00