• Your shopping cart is empty!

  • JEDEC EIA 318-B

JEDEC EIA 318-B

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

JEDEC Solid State Technology Association, 07/01/1996

Publisher: JEDEC

File Format: PDF

$29.00$59.00


Published:01/07/1996

Pages:18

File Size:1 file , 480 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.

More JEDEC standard pdf

JEDEC JESD225

JEDEC JESD225

UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSION

$39.00 $78.00

JEDEC JESD22-B106E

JEDEC JESD22-B106E

RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES

$27.00 $54.00

JEDEC JESD31E

JEDEC JESD31E

GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES

$37.00 $74.00

JEDEC JESD22-A106B.01

JEDEC JESD22-A106B.01

THERMAL SHOCK

$25.00 $51.00