JEDEC EIA 318-B

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

JEDEC Solid State Technology Association, 07/01/1996

Publisher: JEDEC

File Format: PDF

$29.00$59.00

Description

Published:01/07/1996

Pages:18

File Size:1 file , 480 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.

More JEDEC standard pdf

JEDEC JESD87

STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS

$27.00 $54.00

JEDEC JESD85

METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS

$36.00 $72.00

JEDEC JESD82-2

STANDARD FOR DESCRIPTION OF A 3.3 V, 18-BIT, LVTTL I/O REGISTER FOR PC133 REGISTERED DIMM APPLICATIONS

$28.00 $56.00

JEDEC JESD22-A109A

HERMETICITY

$27.00 $54.00