• Your shopping cart is empty!

  • JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 03/01/1966

Publisher: JEDEC

File Format: PDF

$25.00$51.00


Published:01/03/1966

Pages:9

File Size:1 file , 300 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

More JEDEC standard pdf

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

$27.00 $54.00

JEDEC JESD6 (R2002)

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

$29.00 $59.00

JEDEC JESD284-A (R2002)

JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE

$24.00 $48.00

JEDEC JESD216C

JEDEC JESD216C

SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)

$95.00 $191.00