JEDEC EIA 397-1

ADDENDUM No. 1 TO EIA-397

JEDEC Solid State Technology Association, 07/01/1980

Publisher: JEDEC

File Format: PDF

$53.00$106.00

Published:01/07/1980

Pages:68

File Size:1 file

Note:This product is unavailable in Russia, Ukraine, Belarus

A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972.

MECHANICAL SHOCK

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APPLICATION THERMAL DERATING METHODOLOGIES

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BUS INTERCONNECT LOGIC (BIC) FOR 1.2 V

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A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES

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