Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$119.00$238.01
Published:01/12/2022
Pages:26
File Size:1 file , 1.2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
This method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility.
Descriptive Designation System for Semiconductor-device Packages
$40.00 $80.00
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
$31.00 $62.00
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
$37.00 $74.00
Byte Addressable Energy Backed Interface
$81.00 $163.00
