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JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$119.00$238.01
Published:01/12/2022
Pages:26
File Size:1 file , 1.2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
This method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility.
TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES:
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ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS
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MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODES
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DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
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