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JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$119.00$238.01
Published:01/12/2022
Pages:26
File Size:1 file , 1.2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
This method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility.
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ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) - Device Level
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Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products