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JEDEC Solid State Technology Association, 05/01/2007
Publisher: JEDEC
File Format: PDF
$29.00$59.00
Published:01/05/2007
Pages:17
File Size:1 file , 320 KB
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ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
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PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
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LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD
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GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
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