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  • JEDEC JEP 122E

JEDEC JEP 122E

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 03/01/2009

Publisher: JEDEC

File Format: PDF

$70.00$141.00


Published:01/03/2009

Pages:94

File Size:1 file , 1.7 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.

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