• JEDEC JEP 122F

JEDEC JEP 122F

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 11/01/2010

Publisher: JEDEC

File Format: PDF

$70.00$141.00


Published:01/11/2010

Pages:105

File Size:1 file , 2 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum of the Failure Rates method.

More JEDEC standard pdf

JEDEC JESD30H

JEDEC JESD30H

Descriptive Designation System for Semiconductor-device Packages

$58.00 $116.00

JEDEC JESD250

JEDEC JESD250

Graphics Double Data Rate (GDDR6) SGRAM Standard

$114.00 $228.00

JEDEC JESD224A

JEDEC JESD224A

Universal Flash Storage (UFS) Test

$152.00 $305.00

JEDEC JESD22-A108F

JEDEC JESD22-A108F

TEMPERATURE, BIAS, AND OPERATING LIFE

$27.00 $54.00