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JEDEC Solid State Technology Association, 11/01/2010
Publisher: JEDEC
File Format: PDF
$70.00$141.00
Published:01/11/2010
Pages:105
File Size:1 file , 2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
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MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHF
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METHOD OF DIODE Q MEASUREMENT
STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
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