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JEDEC Solid State Technology Association, 11/01/1991
Publisher: JEDEC
File Format: PDF
$70.00$141.00
Published:01/11/1991
Pages:86
File Size:1 file , 3.4 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
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Low Power Double Data Rate 3 SDRAM (LPDDR3)
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STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
$26.00 $53.00
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
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