• Your shopping cart is empty!

  • JEDEC JEP119A

JEDEC JEP119A

A PROCEDURE FOR EXECUTING SWEAT

JEDEC Solid State Technology Association, 08/01/2003

Publisher: JEDEC

File Format: PDF

$37.00$74.00


Published:01/08/2003

Pages:32

File Size:1 file , 270 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M - 96.

More JEDEC standard pdf

JEDEC JESD671C

JEDEC JESD671C

Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)

$31.00 $62.00

JEDEC J-STD-033D

JEDEC J-STD-033D

Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices

$44.00 $89.00

JEDEC JEP155B

JEDEC JEP155B

RECOMMENDED ESD TARGET LEVELS FOR HBM QUALIFICATION

$45.00 $91.00

JEDEC J-STD-033D

JEDEC J-STD-033D

Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices

$39.00 $79.00