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JEDEC Solid State Technology Association, 08/01/2003
Publisher: JEDEC
File Format: PDF
$37.00$74.00
Published:01/08/2003
Pages:32
File Size:1 file , 270 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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