JEDEC JEP121A

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION

JEDEC Solid State Technology Association, 10/01/2006

Publisher: JEDEC

File Format: PDF

$38.00$76.00

Description

Published:01/10/2006

Pages:35

File Size:1 file , 190 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.

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