• Your shopping cart is empty!

  • JEDEC JEP122G

JEDEC JEP122G

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 10/01/2011

Publisher: JEDEC

File Format: PDF

$81.00$163.00


Published:01/10/2011

Pages:108

File Size:1 file , 2.1 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.

More JEDEC standard pdf

JEDEC JESD22-A109A

JEDEC JESD22-A109A

HERMETICITY

$27.00 $54.00

JEDEC JESD76-1

JEDEC JESD76-1

STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (WIDE RANGE OPERATION)

$24.00 $48.00

JEDEC JESD76-2

JEDEC JESD76-2

STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (NORMAL RANGE OPERATION)

$24.00 $48.00

JEDEC JESD51-11

JEDEC JESD51-11

TEST BOARDS FOR THROUGH-HOLE AREA ARRAY LEADED PACKAGE THERMAL MEASUREMENT

$29.00 $59.00