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JEDEC Solid State Technology Association, 04/01/2012
Publisher: JEDEC
File Format: PDF
$33.00$67.00
Published:01/04/2012
Pages:26
File Size:1 file , 160 KB
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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