Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$132.00$265.09
Published:01/12/2022
Pages:40
File Size:1 file , 520 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This guideline provides a methodology to characterize a new or existing process and is applicable to any manufacturing or service process. It describes when to use specific tools such as failure mode effects analysis (FEMA), design or experiments (DOE), measurement system evaluation (MSE), capability analysis (CpK), statistical process control (SPC), and problem solving tools. It also provides a brief description of each tool.
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
$115.00 $230.68
IC LATCH-UP TEST
$128.00 $256.45
Test Method for the Measurement of Moisture Diffusivity and Water Solubility in Organic Materials Used in Electronic Devices
$30.00 $60.00
TS5111, TS5110 Serial Bus Thermal Sensor Device Standard
$58.00 $116.00
