• JEDEC JEP134

JEDEC JEP134

GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS

JEDEC Solid State Technology Association, 09/01/1998

Publisher: JEDEC

File Format: PDF

$28.00$56.00


Published:01/09/1998

Pages:15

File Size:1 file , 120 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis.

More JEDEC standard pdf

JEDEC JEP167

JEDEC JEP167

Characterization of Interfacial Adhesion in Semiconductor Packages

$36.00 $72.00

JEDEC JESD22-A107C

JEDEC JESD22-A107C

Salt Atmosphere

$24.00 $48.00

JEDEC JESD224

JEDEC JESD224

Universal Flash Storage (UFS) Test

$152.00 $305.00

JEDEC JESD79-3-1A

JEDEC JESD79-3-1A

Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600

$33.00 $67.00