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JEDEC Solid State Technology Association, 05/01/2004
Publisher: JEDEC
File Format: PDF
$26.00$53.00
Published:01/05/2004
Pages:12
File Size:1 file , 46 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS
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STANDARD FOR DESCRIPTION OF 3867 - 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH
$25.00 $51.00
SCALABLE LOW-VOLTAGE SIGNALING FOR 400 MV (SLVS-400)
$26.00 $53.00
BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16, 18, AND 20-BIT LOGIC FUNCTIONS USING A 54 BALL PACKAGE
$24.00 $48.00