JEDEC JEP138

USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

JEDEC Solid State Technology Association, 09/01/1999

Publisher: JEDEC

File Format: PDF

$26.00$53.00

Description

Published:01/09/1999

Pages:11

File Size:1 file , 54 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.

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