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JEDEC Solid State Technology Association, 05/01/2002
Publisher: JEDEC
File Format: PDF
$107.00$214.01
Published:01/05/2002
Pages:29
File Size:1 file , 410 KB
Note:This product is unavailable in Russia, Belarus
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Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs
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Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)
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