• JEDEC JEP151

JEDEC JEP151

Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

JEDEC Solid State Technology Association, 11/30/2015

Publisher: JEDEC

File Format: PDF

$31.00$62.00


Published:30/11/2015

Pages:24

File Size:1 file , 350 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test method defines the requirements and procedures for terrestrial destructive* single-event effects (SEE) for example, single-event breakdown (SEB), single-event latch-up (SEL) and single-event gate rupture (SEGR) testing . It is valid when using an accelerator, generating a nucleon beam of either; 1) Mono-energetic protons or mono-energetic neutrons of at least 150 MeV energy, or 2) Neutrons from a spallation spectrum with maximum energy of at least 150 MeV. This test method does not apply to testing that uses beams with particles heavier than protons.

More JEDEC standard pdf

JEDEC JESD82-13A.01

JEDEC JESD82-13A.01

Definition of the SSTVN16859 2.5-2.6 V 13-Bit to 26-Bit SSTL_2 Registered Buffer for PC1600, PC2100, PC2700, and PC3200 DDR DIMM Applications

$124.00 $248.86

JEDEC JEP130C

JEDEC JEP130C

Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)

$124.00 $248.40

JEDEC /ESDA JTR002-01-22

JEDEC /ESDA JTR002-01-22

Charged Device Model Testing of Integrated Circuits

$145.00 $291.54

JEDEC /ESDA JS-002-2022

JEDEC /ESDA JS-002-2022

For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level

$146.00 $292.43