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JEDEC Solid State Technology Association, 10/01/2009
Publisher: JEDEC
File Format: PDF
$95.00$191.00
Published:01/10/2009
Pages:127
File Size:1 file , 2.7 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
Graphics Double Data Rate (GDDR5) SGRAM Standard
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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