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  • JEDEC JEP163

JEDEC JEP163

SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS

JEDEC Solid State Technology Association, 09/01/2015

Publisher: JEDEC

File Format: PDF

$36.00$72.00


Published:01/09/2015

Pages:28

File Size:1 file , 290 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication is intended as a guideline to develop and establish conditions for burn-in and life test of MIL-PRF-38535 QML integrated circuits. These guidelines are intended to provide manufacturers with a consistent means of defining burn-in and life test stress and electrical test requirements acceptable to user organizations and for the development of Standard Military Drawings.

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