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JEDEC Solid State Technology Association, 04/01/2021
Publisher: JEDEC
File Format: PDF
$27.00$54.00
Published:01/04/2021
Pages:14
File Size:1 file , 850 KB
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ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
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INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
$39.00 $78.00
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES
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