Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 02/01/2020
Publisher: JEDEC
File Format: PDF
$37.00$74.00
Published:01/02/2020
Pages:32
File Size:1 file , 970 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
$104.00 $208.97
THERMAL SHOCK
$112.00 $225.35
PROCESS CHARACTERIZATION GUIDELINE
$132.00 $265.09
Guidelines for Gate Charge (QG) Test Method for SiC MOSFET
$147.00 $294.62