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JEDEC Solid State Technology Association, 12/01/2021
Publisher: JEDEC
File Format: PDF
$26.00$53.00
Published:01/12/2021
Pages:12
File Size:1 file , 260 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This guideline describes different techniques for specifying a Transient Off-state Withstand Voltage Robustness Indicator in datasheets for lateral GaN power conversion devices. This guideline does not convey preferences for any of the specification types presented, nor does the guideline address formatting of datasheets. This guideline does not indicate nor require that the datasheet parameters are used in production tests, nor specify how the values were obtained.
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
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BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
Potential Failure Mode and Effects Analysis (FMEA)
