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JEDEC Solid State Technology Association, 12/01/2021
Publisher: JEDEC
File Format: PDF
$26.00$53.00
Published:01/12/2021
Pages:12
File Size:1 file , 260 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This guideline describes different techniques for specifying a Transient Off-state Withstand Voltage Robustness Indicator in datasheets for lateral GaN power conversion devices. This guideline does not convey preferences for any of the specification types presented, nor does the guideline address formatting of datasheets. This guideline does not indicate nor require that the datasheet parameters are used in production tests, nor specify how the values were obtained.
TEST BOARDS FOR THROUGH-HOLE PERIMETER LEADED PACKAGE THERMAL MEASUREMENTS
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TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS
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INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS
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DESCRIPTION OF 1.8 V CMOS LOGIC DEVICES
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