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JEDEC Solid State Technology Association, 02/01/2023
Publisher: JEDEC
File Format: PDF
$121.00$242.39
Published:01/02/2023
Pages:30
File Size:1 file , 670 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This document provides guidelines for evaluating gate reliability and lifetime testing for silicon carbide (SiC) based power devices with a gate oxide or gate dielectric.
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN INTEGRATED CIRCUITS
$27.00 $54.00
CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
$30.00 $60.00
GUIDELINE FOR CHARACTERIZING SOLDER BUMP ELECTROMIGRATION UNDER CONSTANT CURRENT AND TEMPERATURE STRESS
$38.00 $76.00
EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD
