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JEDEC Solid State Technology Association, 02/01/2023
Publisher: JEDEC
File Format: PDF
$121.00$242.39
Published:01/02/2023
Pages:30
File Size:1 file , 670 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This document provides guidelines for evaluating gate reliability and lifetime testing for silicon carbide (SiC) based power devices with a gate oxide or gate dielectric.
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
$30.00 $60.00
PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
$36.00 $72.00
DRIVER SPECIFICATIONS FOR 1.8 V POWER SUPPLY POINT-TO-POINT DRIVERS
$25.00 $51.00
MECHANICAL SHOCK
$26.00 $53.00
