JEDEC JEP195

Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion

JEDEC Solid State Technology Association, 02/01/2023

Publisher: JEDEC

File Format: PDF

$114.00$228.78

Description

Published:01/02/2023

Pages:22

File Size:1 file , 570 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document elaborates on the information given in JEP184 regarding the long-time stability of device parameters under static conditions and under application near switching conditions.

More JEDEC standard pdf

JEDEC JESD220A

Universal Flash Storage (UFS)

$177.00 $355.00

JEDEC JESD223A

Universal Flash Storage (UFS) Host Controller Interface

$45.00 $91.00

JEDEC JS709A

JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)

$29.00 $59.00

JEDEC JESD84-B451

Embedded Multi-media card (e*MMC), Electrical Standard 4.51

$142.00 $284.00