JEDEC JEP195

Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion

JEDEC Solid State Technology Association, 02/01/2023

Publisher: JEDEC

File Format: PDF

$114.00$228.78


Published:01/02/2023

Pages:22

File Size:1 file , 570 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document elaborates on the information given in JEP184 regarding the long-time stability of device parameters under static conditions and under application near switching conditions.

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