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JEDEC Solid State Technology Association, 02/01/2023
Publisher: JEDEC
File Format: PDF
$114.00$228.78
Published:01/02/2023
Pages:22
File Size:1 file , 570 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
This document elaborates on the information given in JEP184 regarding the long-time stability of device parameters under static conditions and under application near switching conditions.
GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
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MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
