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JEDEC Solid State Technology Association, 09/01/1986
Publisher: JEDEC
File Format: PDF
$104.00$208.00
Published:01/09/1986
File Size:1 file
Note:This product is unavailable in Russia, Ukraine, Belarus
Graphics Double Data Rate (GDDR5) SGRAM Standard
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Descriptive Designation System for Semiconductor-device Packages
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Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
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Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
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